Paul Midgley
British materials scientist (born 1966)
- Electron tomography
- Electron diffraction
- Electron holography
- Carbon nanotubes
- Nanotomography
- University of Bristol
- University of Cambridge
Paul Anthony Midgley (born 1966)[2] FRS is a Professor of Materials Science in the Department of Materials Science and Metallurgy at the University of Cambridge[3][4] and a fellow of Peterhouse, Cambridge.
Education
Midgley was educated at the University of Bristol where he was awarded a Master of Science degree in 1988[5] and a PhD in 1991[6] for work on electron microscopy of high-temperature superconductors.
Career
Before moving to Cambridge in 1997, Midgley held two postdoctoral research fellowships in the Henry Herbert Wills Physics Laboratory at the University of Bristol.
Research
Midgley's research interests are in electron tomography, electron holography, energy-filtered imaging and ab initio structure determination by electron diffraction.[7][8][9][10][11] During his research, Midgley has collaborated with Mark Welland,[12] Rafal Dunin-Borkowski,[13] Neil Mathur,[14] John Meurig Thomas,[15][16] Brian F. G. Johnson[15] and Henning Sirringhaus.[17]
Midgley's research has been funded by the Engineering and Physical Sciences Research Council (EPSRC),[18] the Royal Commission for the Exhibition of 1851 and the Royal Society.[7]
Awards and honours
Midgley was elected a Fellow of the Royal Society (FRS) in 2014. His nomination reads:
Midgley is distinguished for many innovations and impressive applications of transmission microscopy, diffraction and spectroscopy, particularly the pioneering development of sub-nanometre-scale electron tomography. His combination of high-angle dark field tomography and spectroscopy revolutionises the 3-d characterisation of materials and heterogeneous catalysts. He has successfully mapped dislocation networks with diffraction contrast tomography. With his world leading position in medium resolution electron holography, he has been able to combine this with tomography in 3-d mapping of electric fields and dopant distributions in semiconductor devices. His brilliant applications of electron diffraction to sub-micron structures, heavy fermion systems and mixed-valent manganites were important breakthroughs.[1]
References
- ^ a b "Professor Paul Midgley FRS". London: The Royal Society. Archived from the original on 11 November 2014.
- ^ a b c "MIDGLEY, Prof. Paul Anthony". Who's Who. Vol. 2015 (online Oxford University Press ed.). A & C Black. (Subscription or UK public library membership required.)
- ^ Paul Midgley publications indexed by Microsoft Academic
- ^ Paul Midgley's publications indexed by the Scopus bibliographic database. (subscription required)
- ^ Midgley, Paul Anthony (1988). Characterisation of Bi-Sr-Ca-Cu-O superconductor (MSc thesis). University of Bristol.
- ^ Midgley, Paul Anthony (1991). Electron microscopy of high Tc superconductors and related oxides (PhD thesis). University of Bristol.
- ^ a b Professor Paul A. Midgley, University of Cambridge
- ^ Midgley, P. A.; Weyland, M. (2003). "3D electron microscopy in the physical sciences: The development of Z-contrast and EFTEM tomography". Ultramicroscopy. 96 (3–4): 413–31. doi:10.1016/S0304-3991(03)00105-0. PMID 12871805.
- ^ Vincent, R.; Midgley, P. A. (1994). "Double conical beam-rocking system for measurement of integrated electron diffraction intensities". Ultramicroscopy. 53 (3): 271–282. doi:10.1016/0304-3991(94)90039-6.
- ^ Gamarra, D.; Munuera, G.; Hungria, A. B.; Fernandez-Garcia, M.; Conesa, J. C.; Midgley, P. A.; Wang, X. Q.; Hanson, J. C.; Rodriguez, J. A.; Martinez-Arias, A. (2007). "Structure-Activity Relationship in Nanostructured Copper-Ceria-Based Preferential CO Oxidation Catalysts". Journal of Physical Chemistry C. 111 (29): 11026–11038. doi:10.1021/jp072243k.
- ^ Midgley, P. A.; Ward, E. P. W.; Hungría, A. B.; Thomas, J. M. (2007). "Nanotomography in the chemical, biological and materials sciences". Chemical Society Reviews. 36 (9): 1477–94. doi:10.1039/b701569k. PMID 17660880.
- ^ Porter, A. E.; Gass, M.; Muller, K.; Skepper, J. N.; Midgley, P. A.; Welland, M. (2007). "Direct imaging of single-walled carbon nanotubes in cells". Nature Nanotechnology. 2 (11): 713–7. Bibcode:2007NatNa...2..713P. doi:10.1038/nnano.2007.347. PMID 18654411.
- ^ Midgley, P. A.; Dunin-Borkowski, R. E. (2009). "Electron tomography and holography in materials science". Nature Materials. 8 (4): 271–80. Bibcode:2009NatMa...8..271M. doi:10.1038/nmat2406. PMID 19308086.
- ^ Loudon, J. C.; Mathur, N. D.; Midgley, P. A. (2002). "Charge-ordered ferromagnetic phase in La0.5Ca0.5MnO3". Nature. 420 (6917): 797–800. arXiv:cond-mat/0209436. Bibcode:2002Natur.420..797L. doi:10.1038/nature01299. PMID 12490944. S2CID 4382641.
- ^ a b Midgley, P. A.; Weyland, M.; Thomas, J. M.; Johnson, B. F. G. (2001). "Z-Contrast tomography: A technique in three-dimensional nanostructural analysis based on Rutherford scattering". Chemical Communications (10): 907–908. doi:10.1039/B101819C.
- ^ Thomas, J. M.; Johnson, B. F. G.; Raja, R.; Sankar, G.; Midgley, P. A. (2003). "High-Performance Nanocatalysts for Single-Step Hydrogenations". Accounts of Chemical Research. 36 (1): 20–30. doi:10.1021/ar990017q. PMID 12534301.
- ^ Eggeman, A. S.; Illig, S.; Troisi, A.; Sirringhaus, H.; Midgley, P. A. (2013). "Measurement of molecular motion in organic semiconductors by thermal diffuse electron scattering". Nature Materials. 12 (11): 1045–1049. Bibcode:2013NatMa..12.1045E. doi:10.1038/nmat3710. PMID 23892786.
- ^ UK Government research grants awarded to Paul Midgley, via Research Councils UK
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- Crystal structure
- Unit cell
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- Bravais lattice
- Crystal system
- Hermann–Mauguin notation
- Bragg's law
- Bragg plane
- Ewald's sphere
- Friedel's law
- Structure factor
- Pair distribution function
- Electron diffraction
- Electron density
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- Phase problem
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- R-factor
- Debye–Waller factor
- Thermal ellipsoid
- Powder diffraction
- Radiation damage
- Crystallographic defects
- X-ray diffraction
- Patterson map
- Direct methods (crystallography)
- Molecular replacement
- Single particle analysis
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